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X-Ray Flourescence(XRF)

X-Ray Fluorescence Spectrometer is used to determine the composition of the material. The material can be anything from rocks, minerals, catalyst to metals and composites. The composition of a material is identified by its characteristic X-ray. The sample is irradiated by X-rays and the characteristic X-rays generated are detected and quantified by the software to form a spectrum. The peak height in the graph determines the concentration of the element present in the sample. in XRF analysis, element detection can be done at ppm/ppb level.

Sample Preparation

For XRF sample preparation, an ideal sample is considered having flat surface, as rough surface can lead to scattering and this can affect the intensity of the X-Rays detected.That’s why it is advised that if XRF is to be performed on a solid sample, the sample surface should be smooth as it will give more accurate data.

Similarly to ensure the flat surface of the sample, the powder or liquid samples are placed in a plastic cup along with a plastic film to achieve desired outcome .

The XRF are categorized into following:

Energy Dispersive XRF(ED-XRF)

Wavelength Dispersive XRF (WD-XRF)



Monochromatic micro XRF

Monochromatic Wavelength Dispersive XRF

HandHeld XRF

In ED-XRF the different energies of X-Rays are measured that has been generated from sample at once and after that the X-Rays are separated as per the characteristic elements. The resolution ranges from 150ev-600ev. The ED-XRF can detect elements ranges from Na to U.

In WD-XRF, the sample is irradiated by X-Rays and then the prism/crystal is used on which the elemental X-Rays produced are focussed which leads to the diffraction and the static detector detects the different wavelength of the diffracted rays of characteristic elements. This leads to higher working resolution. The WD-XRF can detect elements from Be.

There are different methods for the quantification in XRF analysis, namely Compensation Methods, Matrix Correction methods and minimization of matrix effects. These methods

depend on different factors like penetration depth and detection limit of the X-rays in a sample.

One of the major limitations of XRF is that it cannot detect the elements which are present in very small concentration. XRF analysis can be used for the detection of composition present in larger quantities. This analysis technique is widely used to determine the concentration for early detection on samples such as minerals, polymers, archaeological, geological and metallurgical samples.

Sprint Testing Solutions has extensive XRF analysis facilities The experts performing these analysis are having years of experience and can provide their consultation for any query you may have not just about this technique but also any issue regarding your sample analysis.


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