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Material Characterization and Failure Analysis Testing

The Materials Characterization facilities at Sprint Testing specialize in microscopy, surface analysis, optical spectroscopy, physical property determination, chemical analysis, and much more. These techniques help to understand why different materials show different properties and behaviours correlation of properties. Sprint Testing has extensive experience in visualizing and understanding a diverse range of materials. We have worked with metals, ceramics, coated particles and polymers, as well as graphene and other nanomaterials. In most cases, we take care of sample preparation, test design, and analysis of the images obtained after microscopic examination.

Services offered by Sprint include the following

AFM

Contact Angle

Density

Dynamic Mechanical Analysis (DMA)

Differential Scanning Calorimetry (DSC)

Differential Thermal Analysis (DTA)

Electron Backscatter EBSD

Energy Dispersive Spectroscopy (EDS)

Nanoindentation

FIB

Optical Microscopy

Optical Profilometry

Particle Size distribution

Raman Spectroscopy

Sample Preparation for microstructure analysis

Secondary Ion Mass Spectroscopy (SIMS)

Scanning Electron Microscopy (SEM)

Surface Area

Transmission Electron Microscopy (TEM)

Thermogravimetric Analysis (TGA)

TOF-SIMS

UV-Vis-NIR

X-Ray Scattering

X-ray Photoluminescence Spectroscopy (XPS)

Zeta Potential

Scanning Electron Microscopy (SEM):

Scanning Electron Microscopy (SEM) analysis is used to study microstructure of materials from micro to nano meter range. Sprint Testing specializes in Field Emission Scanning Electron Microscopy (FESEM). We can do high vacuum, high resolution SEM to evaluate surface structure. Environmental scanning electron microscopy can also be performed on hydrated samples.

Transmission Electron Microscopy (TEM):

Transmission electron microscopy (TEM) is a high magnification measurement technique that images the transmission of a beam of electrons through a sample. Amplitude and phase variations in the transmitted beam provide imaging contrast that is a function of the sample thickness (the amount of material that the electron beam must pass through) and the sample material. high resolution microscopy showing bulk structure based on electron density differences.

Energy Dispersive Spectroscopy (EDS):

Energy Dispersive Spectroscopy provides elemental information about the composition of the structure of the surface of a sample. Performed in conjunction with SEM and TEM. Elements with atomic numbers down to carbon can be viewed with EDS technique.

Atomic Force Microscopy (AFM):

Atomic Force Microscopy is a surface profilometry technique which gives topographical information. It is used to measure Surface roughness, Nanotechnology surface studies, Atomic level surface modification and Material defects.

Raman spectroscopy:

Raman spectroscopy is a spectroscopic technique based on inelastic scattering of monochromatic light, usually from a laser source. Inelastic scattering means that the frequency of photons in monochromatic light changes upon interaction with a sample. This study is useful to understand the composition and the make up of materials.

Thermogravimetric analysis (TGA):

Thermogravimetric analysis is an analytical technique used to determine a material's thermal stability and its fraction of volatile components by monitoring the weight change that occurs as a sample is heated at a constant rate. Sprint Testing has capabilities to study various materials and determine the stability.

Failure Analysis:

Sprint Testing also specializes in Failure Analysis to determine the root cause of a product, component or system failure. We provide detailed analysis of materials to assess strength, durability, production flaws and product quality.

Our team of consultants go an extra mile to understand customer's requirements, whether a simple failure analysis or a comprehensive failure investigation that involves consultancy, investigation and intensive laboratory work. Typical Failure Analysis studies involve:

Visual Examination

Optical Microscopy

Scanning Electron Microscopy (SEM/EDS)

Electrical Inspection

Cross-section Analysis

Contamination Analysis

Thermal Analysis

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    Sprint Testing Solutions

  • 1111, 1st Floor, Heera Panna Shopping Centre, Hiranandani, Powai, Mumbai 400076, India
  • Phone: +918655567444

    Email ID:Info@sprinttesting.com