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Chemical Analysis Testing

At Sprint Testing Solutions, chemical analysis is driven by client need of benchmark testing, product comparison, product verification, and failure analysis services for all industries on an array of materials. Methodology used for testing is based on the materials being analyzed. Testing is performed in accordance with industry standard practices specified by customer or other approved methods. We also do method development for special tests requirements.

Chemical analysis involves the following (but not limited to) standard tests:

Wet Chemistry

Inductively Coupled Plasma Spectroscopy (ICP)

Optical Emission Spectroscopy (OES)

X-ray Photoelectron Spectroscopy (XPS)

X-ray Fluorescence (XRF)(ED and WD)

X-ray Diffraction (XRD)

Gas Chromatography (GC)

High Pressure Liquid Chromatography (HPLC)

Fourier Transform Infrared Spectrophotometer [F.T.I.R.]

Carbon Sulphur

Particulate Matter

Atomic Absorption Spectrophotometer (AAS)

UV - Visible Spectroscopy (UV-Vis)

Nuclear Magnetic Resonance Spectroscopy (NMR)

Elemental Analysis Using Elemental Analyzer

C, H, N, S, O Analysis.

TOC Analysis

Positive Material Identification (PMI)

Chemiluminescence and UV-Fluorescence

Ion Chromatography (IC)

Energy Dispersive X-ray Spectroscopy(EDS)

Surface Area Analysis by BET

Porosity Measurement by Mercury Porosimeter

Wet Chemistry:

Wet Chemistry is the general category of bench-top tests involving titrations, distillations, and varying chemical reactions. Traditional techniques such as Colorimetry, Gravimetry and Titration are typical wet method of element analysis using laboratory beakers and flasks to determine presence of a particular element.


Inductively Coupled Plasma Spectroscopy (ICP) analysis uses the powdered/crushed material or liquids which are first digested into a solution and later analyzed by ICP for the elemental composition. The quantification is as total metal and each element reported individually. Elements such as Al, Ag, As, Ba, Be, Cd, Cr, Ca, Co, Cr, Cu, Fe, K, Li, Mg, Mn, Mo, Na, Ni, P, Pb, Sb, Si, Sn, Ti, V, W, Zn are reported as either Elemental or Elemental Oxides.


Optical Emission Spectroscopy (OES) is used to determine the elemental composition of solid metals. It is typically done of flat surfaces of smaller specimens for material verification and failure analysis. Spark is generated on a cleaned and polished surface of the specimen to determine the elemental composition. Al, Cr, Cu, Mn, Mo, Ni, Nb, P, Si, Ti, V , Fe-Balance are easily determined.


X-ray Photoelectron Spectroscopy (XPS) is a surface analysis technique provides valuable quantitative and chemical state information from the surface of the material being studied. The average depth of analysis for an XPS measurement is approximately 5 nm.


Positive Material Identification (PMI) provides quick compositional analysis of metals and alloys by a non destructive test (NDT) technique. The Positive Material Identification test analyzes chemical composition for material identification and verification purposes. PMI is used to identify and determine material composition non-destructively.


Brunauer, Emmett and Teller (BET) analysis is used to measure the specific surface area and the pore size distribution of a sample. This information is used to predict the dissolution rate, which is proportional to the specific surface area. It is useful in evaluation of product performance and manufacturing consistency.


Energy Dispersive X-ray Spectroscopy (EDS) is a qualitative and semi-quantitative X-ray microanalytical technique used to determine elemental composition of a sample by capturing and identifying signature X-Rays. EDS detector is usually used with Scanning Electron Microscope (SEM) or Transmission Electron Microscope (TEM).


X-ray fluorescence (XRF) is a non-destructive technique used to determine the chemistry of a sample by measuring the fluorescent (or secondary) X-ray emitted from a sample when it is excited by a primary X-ray source. This technique is commonly used for inorganic powders or ceramics composites. Oxides such as SiO2, Al2O3, CaO, MgO, P2O5, K2O, Na2O, Fe2O3, MnO, TiO2, Cr2O3, V2O4, ZrO2, are commonly analysed using XRF.


X-ray Diffraction (XRD) studies are performed on solid materials. This technique provides the Crystalline Phase Identification to determine the compounds present in the given material. This technique is essential to understanding the elemental makeup of the material.


Fourier transform infrared (FTIR) spectroscopy involves passing of IR radiation through a sample, some radiation is absorbed by the sample and some is transmitted. The resulting signal at the detector is a spectrum representing a molecular fingerprint of the material. It is used to determine simple compounds in a sample.

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    Sprint Testing Solutions

  • 1111, 1st Floor, Heera Panna Shopping Centre, Hiranandani, Powai, Mumbai 400076, India
  • Phone: +918655567444

    Email ID:Info@sprinttesting.com